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Oxford Instruments Workshop

16:00 - 16:30 Thursday, 8th July, 2021

Sessions Company Workshop

Jupiter-XR AFM: High Resolution, High Stability, and High Speed


16:00 - 16:30

389 Jupiter-XR AFM:  High Resolution, High Stability, and High Speed

Director of Applications Jason Li, Jupiter Product Manager Marta Kocun, Application Specialist Eric Valois
Oxford Instruments, Santa Barbara, USA

Abstract Text

The Jupiter XR Atomic Force Microscope is the first and only large-sample AFM to offer both high-speed imaging and 100 µm image range in the standard instrument configuration. Jupiter XR enables higher resolution than any other large-sample AFM at scan rates 5-20x faster than most other AFMs. Jupiter XR provides complete 200mm sample access, faster results, a simpler user experience, and the versatility to excel in both academic research and industrial settings. In this virtual workshop, Asylum Research will demonstrate Jupiter’s atomic resolution imaging capability, high-speed imaging as well as blueDrive photothermal excitation. Join us and find out why more customers are choosing Jupiter as their AFM solution.